Description

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HemeraML Series Microscopes are State-of-the-art model for advanced materials science applications

Excellent Ergonomic Design

The ICOE HemeraML’s design provides more comfort and convenience for professional microscopists. The double fine and coarse focus control knobs can be switched from left to right according to user preference. The anti-slip coated adjustment knobs provide maximum comfort during displacement of the sample. Switching between transmitted and epi-illumination, adjusting light intensity, changing filters, all can be controlled without lifting your hands to prevent fatigue.

– HemeraML Accessories –

Superior Optical Performance – Excellent Infinite System

• 1. ICOE HemeraML series offers superior optical performance for the most demanding applications.
• 2. The excellent infinity system of HemeraML consists of Super wide field SFWF10x25mm eyepieces, high numerical aperture 45mm parafocal objectives and a 200mm focal length tube lens. The 200mm focal length tube lens reduces the angle of the light rays passing through the optics and as a direct result improving significantly the chromatic aberration corrections and contrast. The objectives with larger diameter enable much higher numerical apertures improving the overall resolving power of the optical system

Eyepiece

• 1. Super Wide field SWF10x/25mm, Ø30mm tubes
• 2. Extended Wide Field EWF10x/22mm, Ø30mm tubes (optional)

Viewing Head

• 1. Standard trinocular head: Siedentopf trinocular with 30° inclined tubes. Interpupillary distance adjustable between 47 and 78mm. The trinocular standard head has an optical path selector (100:0/80:20/0:100). Diopter adjustment on both eyepieces
• 2. Ergonomic tilting head: Optional ergonomic 0 to 35° tilting trinocular head supplied with SWF 10x/25mm eyepieces, interpupillary distance between 47-78mm and photo tube with standard Ø23.2mm tube. The trinocular tilting head has an optical path selector (100:0/80:20/0:100). Diopter ± 5 adjustments on both eyepieces

EYE-LEVEL RISER

• The eye-level riser can help raise the eye-point height by 25.4mm

Nosepiece

• The high capacity revolving nosepiece allows six M26 AIS45mm objectives and has been precisely machined for maximum accuracy and repeatability. The reversed angle and ball-beared movement allows increased comfort of use. The nosepiece also has an incorporated slot for a range of sliders such as Nomarski DIC or polarization.

NOSEPIECE LOWERING ATTACHMENT

• With the nosepiece lowering attachment users can lower the height of the nosepiece by 40mm and can therefore use the stage in a lower position as well

OBJECTIVES

All objectives for ICOE HemeraML are 45mm parfocal and have a M26mm mounting thread. All optics are anti-fungus treated and anti-reflection coated for maximum light throughput

• Infinite Plan Semi-Apochromatic 2x/0.06 WD: 7.5mm, no cover glass correction
• Infinite Plan Semi-Apochromatic 5x/0.15 WD: 20mm, no cover glass correction
• Infinite Plan Semi-Apochromatic 10x/0.30 WD: 11mm, no cover glass correction
• Infinite Plan Semi-Apochromatic 20x/0.45 WD: 3.1mm, no cover glass correction
• Infinite Plan Apochromatic 50x/0.80 WD: 1mm, no cover glass correction
• Infinite Plan Apochromatic 100x/0.90 WD: 1mm, no cover glass correction

NOMARSKI DIC

• With the redesign of the DIC module height differences – which normally can not be displayed using brightfield techniques – can now be visualized. These relief like images are ideal for surface inspections of wafers, LCD screens etc

STAGE

• 1. Large 215x170mm stage with 105x105mm integrated right-handed mechanical stage, with glass and metal insert
• 2. Stage height can be lowered for large samples (1 to 28mm standard sample size, large sample size up to 55mm)
• 3. Wafer bracket for 2″,3″,4″ wafer & A shelf for wafer bracket
• Note: For user ergonomics the stage height can be lowered by one inch while maintaining standard sample height, using the optional nosepiece lowering attachment.

LONG WORKING DISTANCE CONDENSER

• In height adjustable long working distance (10.2 mm) N.A. 0.65 condenser with numerical aperture identification marks allows easy setting

FOCUSING

• 1. Coaxial coarse and fine adjustment, 100 graduations, 1μm precision, 100μm per rotation, total travel approximately 35mm
• 2. Supplied with an adjustable rack stop to prevent damage to sample and objectives
• 3. The coarse adjustments are equipped with friction control
• 4. The double fine and coarse focus control knobs can be switched from left to right according to user preference

METALLURGICAL EPI-ILLUMINATOR AND REFLECTED LIGHT

• 1. The rotating disc of the Epi-illuminator enables fast switching between darkfield, brightfield and dimmed brightfield positions, thus improving ease of use. A rotating analyzer combined with polarizer can easily be inserted into the epi-illuminators slots for high quality polarized images. The smoothly controlled field and aperture diaphragms are used to enhance image contrast
• 2. Reflected 100W 24V adjustable halogen adjustable illumination, internal 100-240V power supply.
• 3. LED illumination is optional

TRANSMITTED ILLUMINATOR

• 1. Diascopic intensity adjustable 100W halogen illumination with internal 100-240V power supply. The diascopic halogen illumination comes with two push-in/push-out neutral density filters for smooth attenuation of the light intensity for all kinds of samples
• 2. LED illumination is optional

ECO FUNCTION

• The ECO function is developed to avoid unnecessary loss of energy. The illumination of the microscope automatically switches off shortly after microscopists step away from their position

Various Observation Methods

Darkfield

Darkfield enables the observation of scattered or diffracted light from the specimen. Anything that is not flat reflects this light while anything that is flat appears dark so imperfections clearly stand out. The user can identify the existence of even a minute scratch or flaw down to the 8nm level-smaller than the resolving power limit of an optical microscope. Darkfield is ideal for detecting minute scratches or flaws on a specimen and examining mirror surface specimens, including wafers.

Transmitted Light

For transparent specimen such as LCDs, plastics, and glass materials, true transmitted light observation is available by using a variety of condensers. Examining specimen in transmitted brightfield and polarized light can be accomplished all in one convenient system.

Polarization

This microscopic observation technique utilizes polarized light generated by a set of filters (analyzer and polarizer). The characteristics of the sample directly affect the intensity of the light reflected through the system. It is suitable for metallurgical structures (i.e., growth pattern of graphite on nodular casting iron), minerals, LCDs and, semiconductor materials.

Differential Interference Contrast

DIC technique helps in microscopy to enhance the contrast of samples The technique is based on interferometry to obtain information about the small difference in optical path length between two orthogonally polarized light rays coming from the sample This results in an image of the sample appearing as a three-dimensional physical relief. Polarized light is split into two orthogonally polarized coherent light by a so-called Nomarski-modified Wollaston prism and is then spatially shifted by the sample by a small amount that is normally similar to the resolution of the microscope.

Product Specifications

Product Configurations

Product Dimensions

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